| 장비명 | 국부부식시험기 | 모델명 | M370 |
|---|---|---|---|
| 제작사 | UNISCAN | 도입시기 | 2009년 |
| 설치장소 | 포항금속소재산업진흥원 | ||
| 장비외관 및 사진 |
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| 기기사양 | Scanning Electrochemical Microscopy(SCEM)Scanning Vibrating electrode Technique(SVET)Scanning Kelvin ProveLocallized EISScanning Droplet System 1) Scan range (x, y, z) mm : 70 mm x 70 mm x 70 mm. 2) Scan motor resolution : 8 nanometers. 3) Position encoder type : Linear, zero hysteresis. 4) Closed loop positioning : YES 5) Linear position encoder resolution : 100 nm. 6) Maximum scan speed : 2 mm/sec. 7) Limit switches on all axes : YES 8) Measurement resolution : 16 Bit @100kHz. 9) Techniques : SECM, LEIS, SKP, SVET, SDS, OSP 10) Cell mount : Optical table standard screw fitting. 11) Computer interface : USB 12) Software - computer operating system : Windows XPTM Professional or VistaTM Business |
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| 특성 또는 활용분야 | 마이크로 단위의 국부적인위치에서의 금속의 위치별부식특성 평가 1. Scanning Electrochemical Workstation is designed for ultra-high resolution, spatially resolved electrochemical and non-contact surface topography measurements. 2. The system is available in any or all of the six configurations (SECM, SVET, SKP, LEIS, SDS, OSP) and may be upgraded at a later date by subsequent purchase of any combination of the available options. 3. User defined scan parameters (displacement, velocity, step scan/continuous scan mode, step size, number of data points) 4. Direct real-time readout of displacement in x, y and z via 100nm linear encoders 5. Post data acquisition x,y,z measurement at any point 6. Surface maps acquired at up to 70,000 data points in each axis 7. Height tracking in any map experiment using topography data from any source (SKP topography, OSP or Constant current SECM macro) 8. Fully programmable macro language for non-standard experiments 9. Easy to use, user configurable visual templates 10. User definable 16,777,216 colour palette via easy to use palette editor 11. ASCII exportable data files 12. Full Windows™ clipboard support 금속표면의 국부 부식거동을 평가하기 위한 특화장비로서, 하나의 장비를 구축하여 금속표면의 국부 영역에서의 SECM, SKP, SVET, SDS,LEIS 등 다양한 방식의 부식시험을 할 수 있음 - 시편 표면의 전기화학적 전위 및 전류 profile - 시편 표면의 국부영역에서의 Impedance mapping - Droplet을 이용한 국부영역에서 발생하는 부식전류 측정 |
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- 담당자
- 성명
- 오세영
- 연락처
- 054-279-9473
- liliy530@pomia.or.kr
